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Broadband Microwave Signal Dissipation in Nanostructured Copper Oxide at Air-Film Interface.
Amoah, Papa K; Kosicek, Martin; Perez, Jesus; Sunday, Christopher E; Moreau, Stéphane; Cvelbar, Uros; Obeng, Yaw S.
Afiliação
  • Amoah PK; Physical Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899.
  • Kosicek M; Jozef Stefan Institute, Ljubljana, Slovenia.
  • Perez J; Jozef Stefan International Postgraduate School, Ljubljana, Slovenia.
  • Sunday CE; Physical Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899.
  • Moreau S; Physical Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899.
  • Cvelbar U; Functional Material Group, Department of Chemical Engineering, Cape Peninsula University of Technology, Symphony Way, Bellville, 7535, Cape Town, South Africa.
  • Obeng YS; Univ. Grenoble Alpes, CEA, LETI, 38000 Grenoble, France.
Electroanalysis ; 32(12)2020 Sep 17.
Article em En | MEDLINE | ID: mdl-33658747
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article