Your browser doesn't support javascript.
loading
Correcting Susceptibility Artifacts of MRI Sensors in Brain Scanning: A 3D Anatomy-Guided Deep Learning Approach.
Duong, Soan T M; Phung, Son Lam; Bouzerdoum, Abdesselam; Ang, Sui Paul; Schira, Mark M.
Afiliação
  • Duong STM; School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Wollongong, NSW 2522, Australia.
  • Phung SL; Applied Science Division, VinBrain, VinGroup, Hanoi 100000, Vietnam.
  • Bouzerdoum A; Faculty of Information Technology, Le Quy Don Technical University, Hanoi 122300, Vietnam.
  • Ang SP; School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Wollongong, NSW 2522, Australia.
  • Schira MM; School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Wollongong, NSW 2522, Australia.
Sensors (Basel) ; 21(7)2021 Mar 26.
Article em En | MEDLINE | ID: mdl-33810289
Assuntos
Palavras-chave
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Artefatos / Aprendizado Profundo Idioma: En Ano de publicação: 2021 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Artefatos / Aprendizado Profundo Idioma: En Ano de publicação: 2021 Tipo de documento: Article