Thin-Film-Based SAW Magnetic Field Sensors.

Meyer, Jana Marie; Schell, Viktor; Su, Jingxiang; Fichtner, Simon; Yarar, Erdem; Niekiel, Florian; Giese, Thorsten; Kittmann, Anne; Thormählen, Lars; Lebedev, Vadim; Moench, Stefan; Zukauskaite, Agne; Quandt, Eckhard; Lofink, Fabian.

Afiliação

Meyer JM; Fraunhofer Institute for Silicon Technology ISIT, Fraunhoferstrasse 1, 25524 Itzehoe, Germany.
Schell V; Institute for Materials Science, Kiel University, Kaiserstraße 2, 24143 Kiel, Germany.
Su J; Fraunhofer Institute for Silicon Technology ISIT, Fraunhoferstrasse 1, 25524 Itzehoe, Germany.
Fichtner S; Fraunhofer Institute for Silicon Technology ISIT, Fraunhoferstrasse 1, 25524 Itzehoe, Germany.
Yarar E; Institute for Materials Science, Kiel University, Kaiserstraße 2, 24143 Kiel, Germany.
Niekiel F; Fraunhofer Institute for Silicon Technology ISIT, Fraunhoferstrasse 1, 25524 Itzehoe, Germany.
Giese T; Fraunhofer Institute for Silicon Technology ISIT, Fraunhoferstrasse 1, 25524 Itzehoe, Germany.
Kittmann A; Fraunhofer Institute for Silicon Technology ISIT, Fraunhoferstrasse 1, 25524 Itzehoe, Germany.
Thormählen L; Institute for Materials Science, Kiel University, Kaiserstraße 2, 24143 Kiel, Germany.
Lebedev V; Institute for Materials Science, Kiel University, Kaiserstraße 2, 24143 Kiel, Germany.
Moench S; Fraunhofer Institute for Applied Solid State Physics IAF, Tullastrasse 72, 79108 Freiburg, Germany.
Zukauskaite A; Fraunhofer Institute for Applied Solid State Physics IAF, Tullastrasse 72, 79108 Freiburg, Germany.
Quandt E; Fraunhofer Institute for Applied Solid State Physics IAF, Tullastrasse 72, 79108 Freiburg, Germany.
Lofink F; Institute for Materials Science, Kiel University, Kaiserstraße 2, 24143 Kiel, Germany.