Constrain Effect of Charge Traps in Organic Field-Effect Transistors with Ferroelectric Polymer as a Dielectric Interfacial Layer.

Wu, Yangjiang; Wang, Zhihui; Yang, Longfei; Qiao, Yanjun; Chang, Dongdong; Yan, Yongkun; Wu, Zeng; Hu, Zhijun; Zhang, Jichao; Lu, Xuefeng; Zhao, Yan; Liu, Yunqi

Wu, Yangjiang; Wang, Zhihui; Yang, Longfei; Qiao, Yanjun; Chang, Dongdong; Yan, Yongkun; Wu, Zeng; Hu, Zhijun; Zhang, Jichao; Lu, Xuefeng; Zhao, Yan; Liu, Yunqi.

Afiliação

Wu Y; Department of Materials Science, Fudan University, Shanghai 200433, China.
Wang Z; Department of Materials Science, Fudan University, Shanghai 200433, China.
Yang L; Department of Materials Science, Fudan University, Shanghai 200433, China.
Qiao Y; Department of Materials Science, Fudan University, Shanghai 200433, China.
Chang D; Department of Materials Science, Fudan University, Shanghai 200433, China.
Yan Y; Department of Materials Science, Fudan University, Shanghai 200433, China.
Wu Z; Department of Materials Science, Fudan University, Shanghai 200433, China.
Hu Z; Center for Soft Condensed Matter Physics and Interdisciplinary Research, Soochow University, Suzhou 215006, China.
Zhang J; Shanghai Synchrotron Radiation Facility, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China.
Lu X; Department of Materials Science, Fudan University, Shanghai 200433, China.
Zhao Y; Department of Materials Science, Fudan University, Shanghai 200433, China.
Liu Y; Department of Materials Science, Fudan University, Shanghai 200433, China.