Are 2D Interfaces Really Flat?

Cheng, Zhihui; Zhang, Huairuo; Le, Son T; Abuzaid, Hattan; Li, Guoqing; Cao, Linyou; Davydov, Albert V; Franklin, Aaron D; Richter, Curt A.

Afiliação

Cheng Z; Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
Zhang H; Department of Electrical & Computer Engineering, Purdue University, West Lafayette, Indiana 47907, United States.
Le ST; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
Abuzaid H; Theiss Research, La Jolla, California 92037, United States.
Li G; Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
Cao L; Theiss Research, La Jolla, California 92037, United States.
Davydov AV; Department of Electrical & Computer Engineering, Duke University, Durham, North Carolina 27708, United States.
Franklin AD; Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, United States.
Richter CA; Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, United States.