Your browser doesn't support javascript.
loading
Photo-induced force microscopy (PiFM) - principles and implementations.
Sifat, Abid Anjum; Jahng, Junghoon; Potma, Eric O.
Afiliação
  • Sifat AA; Department of Electrical Engineering and Computer Science, University of California, Irvine, CA, USA.
  • Jahng J; Hyperspectral Nano-imaging Lab, Korea Research Institute of Standards and Science, Daejeon 34113, South Korea.
  • Potma EO; Department of Electrical Engineering and Computer Science, University of California, Irvine, CA, USA.
Chem Soc Rev ; 51(11): 4208-4222, 2022 Jun 06.
Article em En | MEDLINE | ID: mdl-35510630
Photo-induced force microscopy (PiFM) is a scan probe technique that offers images with spectroscopic contrast at a spatial resolution in the nanometer range. PiFM utilizes the non-propagating, enhanced near field at the apex of a sharp tip to locally induce a polarization in the sample, which in turn produces an additional force acting on the cantilevered tip. This photo-induced force, though in the pN range or less, can be extracted from the oscillation properties of the cantilever, thus enabling the generation of photo-induced force maps. Since its inception in 2010, the PiFM technique has grown into a useful nano-spectrocopic tool that has expanded its reach in terms of imaging capabilities and applications. In this review, we present various technical implementations of the PiFM approach. In addition, we discuss the physical origin of the PiFM signal, highlighting the contributions from dipole-dipole forces as well as forces that derive from photo-thermal processes.
Assuntos

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Microscopia de Força Atômica Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Microscopia de Força Atômica Idioma: En Ano de publicação: 2022 Tipo de documento: Article