Quantifying nanoscale forces using machine learning in dynamic atomic force microscopy.

Chandrashekar, Abhilash; Belardinelli, Pierpaolo; Bessa, Miguel A; Staufer, Urs; Alijani, Farbod.

Afiliação

Chandrashekar A; Precision and Microsystems Engineering, TU Delft Delft The Netherlands a.chandrashekar@tudelft.nl f.alijani@tudelft.nl.
Belardinelli P; DICEA, Polytechnic University of Marche Ancona Italy.
Bessa MA; Materials Science and Engineering, TU Delft Delft The Netherlands.
Staufer U; Precision and Microsystems Engineering, TU Delft Delft The Netherlands a.chandrashekar@tudelft.nl f.alijani@tudelft.nl.
Alijani F; Precision and Microsystems Engineering, TU Delft Delft The Netherlands a.chandrashekar@tudelft.nl f.alijani@tudelft.nl.

Nanoscale Adv ; 4(9): 2134-2143, 2022 May 03.

Article em En | MEDLINE | ID: mdl-35601812

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article