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Polariscopy with optical near-fields.
Meguya, Ryu; Ng, Soon Hock; Han, Molong; Anand, Vijayakumar; Katkus, Tomas; Vongsvivut, Jitraporn; Appadoo, Dominique; Nishijima, Yoshiaki; Juodkazis, Saulius; Morikawa, Junko.
Afiliação
  • Meguya R; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Japan.
  • Ng SH; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, Victoria 3122, Australia.
  • Han M; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, Victoria 3122, Australia.
  • Anand V; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, Victoria 3122, Australia.
  • Katkus T; Institute of Physics, University of Tartu, 50411, Tartu, Estonia.
  • Vongsvivut J; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, Victoria 3122, Australia.
  • Appadoo D; Infrared Microspectroscopy (IRM) Beamline, ANSTO-Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria 3168, Australia.
  • Nishijima Y; THz/Far-Infrared Beamline, ANSTO-Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria 3168, Australia.
  • Juodkazis S; Department of Electrical and Computer Engineering, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama, 240-8501, Japan.
  • Morikawa J; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, Victoria 3122, Australia.
Nanoscale Horiz ; 7(9): 1047-1053, 2022 Aug 22.
Article em En | MEDLINE | ID: mdl-35796230
Polarisation analysis of light-matter interactions established for propagating optical far-fields is now extended into an evanescent field as demonstrated in this study using an attenuated total reflection (ATR) setup and a synchrotron source at THz frequencies. Scalar intensity E2, rather than a vector E-field, is used for absorbance analysis of the s- and p-components of the linearly polarised incident light. Absorption and phase changes induced by the sample and detected at the transmission port of the ATR accessory revealed previously non-accessible anisotropy in the absorption-dispersion properties of the sample probed by the evanescent optical near-field. Mapping of the sample's anisotropy perpendicular to its surface by the non-propagating light field is validated and the cos2 θ absorbance dependence was observed for the angle θ, where θ = 0° is aligned with the sample's surface. A four-polarisation method is presented for the absorbance mapping and a complimentary retardance spectrum is retrieved from the same measurement of the angular dependence of transmittance in structurally complex poly-hydroxybutyrate (PHB) and poly-L-lactic acid (PLLA) samples with amorphous and banded-spherulite (radially isotropic) crystalline regions. A possibility of all 3D mapping of anisotropy (polarisation tomography) is outlined.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article