Characterization of Flexible Amorphous Silicon Thin-Film Transistor-Based Detectors with Positive-Intrinsic-Negative Diode in Radiography.

Han, Bongju; Park, Minji; Kim, Kyuseok; Lee, Youngjin.

Afiliação

Han B; Quality Assurance Team, Business Division, Vieworks, 41-3, Burim-ro 170beon-gil, Dongan-gu, Anyang-si 14055, Korea.
Park M; Department of Radiological Science, College of Health Science, Gachon University, 191, Hambakmoe-ro, Yeonsu-gu, Incheon 21936, Korea.
Kim K; Department of Health Science, General Graduate School of Gachon University, 191, Hambakmoe-ro, Yeonsu-gu, Incheon 21936, Korea.
Lee Y; Department of Integrative Medicine, Major in Digital Healthcare, Yonsei University College of Medicine, Unju-ro, Gangman-gu, Seoul 06229, Korea.

Diagnostics (Basel) ; 12(9)2022 Aug 30.

Article em En | MEDLINE | ID: mdl-36140503