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Miniaturized spectrometers with a tunable van der Waals junction.
Yoon, Hoon Hahn; Fernandez, Henry A; Nigmatulin, Fedor; Cai, Weiwei; Yang, Zongyin; Cui, Hanxiao; Ahmed, Faisal; Cui, Xiaoqi; Uddin, Md Gius; Minot, Ethan D; Lipsanen, Harri; Kim, Kwanpyo; Hakonen, Pertti; Hasan, Tawfique; Sun, Zhipei.
Afiliação
  • Yoon HH; Department of Electronics and Nanoengineering, Aalto University, Espoo 02150, Finland.
  • Fernandez HA; QTF Centre of Excellence, Department of Applied Physics, Aalto University, Aalto 00076, Finland.
  • Nigmatulin F; Department of Electronics and Nanoengineering, Aalto University, Espoo 02150, Finland.
  • Cai W; QTF Centre of Excellence, Department of Applied Physics, Aalto University, Aalto 00076, Finland.
  • Yang Z; Department of Electronics and Nanoengineering, Aalto University, Espoo 02150, Finland.
  • Cui H; QTF Centre of Excellence, Department of Applied Physics, Aalto University, Aalto 00076, Finland.
  • Ahmed F; Key Lab of Education Ministry for Power Machinery and Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China.
  • Cui X; College of Information Science and Electronic Engineering and State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China.
  • Uddin MG; School of Aeronautics and Astronautics, Sichuan University, Chengdu 610065, China.
  • Minot ED; Department of Electronics and Nanoengineering, Aalto University, Espoo 02150, Finland.
  • Lipsanen H; Department of Electronics and Nanoengineering, Aalto University, Espoo 02150, Finland.
  • Kim K; QTF Centre of Excellence, Department of Applied Physics, Aalto University, Aalto 00076, Finland.
  • Hakonen P; Department of Electronics and Nanoengineering, Aalto University, Espoo 02150, Finland.
  • Hasan T; QTF Centre of Excellence, Department of Applied Physics, Aalto University, Aalto 00076, Finland.
  • Sun Z; Department of Physics, Oregon State University, Corvallis, OR 97331, USA.
Science ; 378(6617): 296-299, 2022 10 21.
Article em En | MEDLINE | ID: mdl-36264793
ABSTRACT
Miniaturized computational spectrometers, which can obtain incident spectra using a combination of device spectral responses and reconstruction algorithms, are essential for on-chip and implantable applications. Highly sensitive spectral measurement using a single detector allows the footprints of such spectrometers to be scaled down while achieving spectral resolution approaching that of benchtop systems. We report a high-performance computational spectrometer based on a single van der Waals junction with an electrically tunable transport-mediated spectral response. We achieve high peak wavelength accuracy (∼0.36 nanometers), high spectral resolution (∼3 nanometers), broad operation bandwidth (from ∼405 to 845 nanometers), and proof-of-concept spectral imaging. Our approach provides a route toward ultraminiaturization and offers unprecedented performance in accuracy, resolution, and operation bandwidth for single-detector computational spectrometers.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article