Spectroscopy vs. Electrochemistry: Catalyst Layer Thickness Effects on Operando/In Situ Measurements.

Diercks, Justus S; Herranz, Juan; Ebner, Kathrin; Diklic, Natasa; Georgi, Maximilian; Chauhan, Piyush; Clark, Adam H; Nachtegaal, Maarten; Eychmüller, Alexander; Schmidt, Thomas J.

Afiliação

Diercks JS; Electrochemistry Laboratory, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.
Herranz J; Electrochemistry Laboratory, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.
Ebner K; Electrochemistry Laboratory, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.
Diklic N; Electrochemistry Laboratory, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.
Georgi M; Physical Chemistry, TU Dresden, 01062, Dresden, Germany.
Chauhan P; Electrochemistry Laboratory, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.
Clark AH; Laboratory for Synchrotron Radiation and Femtochemistry, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.
Nachtegaal M; Laboratory for Synchrotron Radiation and Femtochemistry, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.
Eychmüller A; Physical Chemistry, TU Dresden, 01062, Dresden, Germany.
Schmidt TJ; Electrochemistry Laboratory, Paul Scherrer Institute, 5232, Villigen-PSI, Switzerland.