Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks.

Sampath, Vignesh; Maurtua, Iñaki; Aguilar Martín, Juan José; Iriondo, Ander; Lluvia, Iker; Aizpurua, Gotzone.

Afiliação

Sampath V; Smart and Autonomous System Unit, Tekniker, Member of Basque Research & Technology Alliance, 20600 Eibar, Spain.
Maurtua I; Department of Design and Manufacturing Engineering, School of Engineering and Architecture, University of Zaragoza, 50009 Zaragoza, Spain.
Aguilar Martín JJ; Smart and Autonomous System Unit, Tekniker, Member of Basque Research & Technology Alliance, 20600 Eibar, Spain.
Iriondo A; Department of Design and Manufacturing Engineering, School of Engineering and Architecture, University of Zaragoza, 50009 Zaragoza, Spain.
Lluvia I; Smart and Autonomous System Unit, Tekniker, Member of Basque Research & Technology Alliance, 20600 Eibar, Spain.
Aizpurua G; Smart and Autonomous System Unit, Tekniker, Member of Basque Research & Technology Alliance, 20600 Eibar, Spain.

Sensors (Basel) ; 23(4)2023 Feb 07.

Article em En | MEDLINE | ID: mdl-36850460