Deep Learning-Assisted Multivariate Analysis for Nanoscale Characterization of Heterogeneous Beam-Sensitive Materials.

Kosasih, Felix Utama; Su, Fanzhi; Du, Tian; Ratnasingham, Sinclair Ryley; Briscoe, Joe; Ducati, Caterina.

Afiliação

Kosasih FU; Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, UK.
Su F; Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, UK.
Du T; School of Engineering and Materials Science and Materials Research Institute, Queen Mary University of London, London E1 4NS, UK.
Ratnasingham SR; School of Engineering and Materials Science and Materials Research Institute, Queen Mary University of London, London E1 4NS, UK.
Briscoe J; Department of Materials and Centre for Processable Electronics, Molecular Science Research Hub, Imperial College London, London W12 0BZ, UK.
Ducati C; School of Engineering and Materials Science and Materials Research Institute, Queen Mary University of London, London E1 4NS, UK.

Microsc Microanal ; 29(3): 1047-1061, 2023 Jun 09.

Article em En | MEDLINE | ID: mdl-37749677

Palavras-chave

convolutional neural network; energy-dispersive X-ray spectroscopy; materials' characterization; principal component analysis; scanning transmission electron microscopy

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article