Continuous Condensed Triplet Accumulation for Irradiance-Induced Anticounterfeit Afterglow.

Badriyah, Ende Hopsah; Hayashi, Kikuya; Sk, Bahadur; Takano, Rina; Ishida, Takayuki; Hirata, Shuzo.

Afiliação

Badriyah EH; Department of Engineering Science, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo, 182-8585, Japan.
Hayashi K; Department of Engineering Science, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo, 182-8585, Japan.
Sk B; Department of Engineering Science, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo, 182-8585, Japan.
Takano R; Department of Engineering Science, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo, 182-8585, Japan.
Ishida T; Department of Engineering Science, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo, 182-8585, Japan.
Hirata S; Department of Engineering Science, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo, 182-8585, Japan.

Adv Sci (Weinh) ; 10(36): e2304374, 2023 Dec.

Article em En | MEDLINE | ID: mdl-37897314