N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.

Liu, Chun-Hsien; Lin, Sheng-Di.

Afiliação

Liu CH; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan.
Lin SD; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan.

Sensors (Basel) ; 23(23)2023 Dec 03.

Article em En | MEDLINE | ID: mdl-38067958

Palavras-chave

CMOS image sensor; light-induced reliability; parasitic BJT action; single-photon avalanche diode (SPAD); transistor degradation

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article