Exploring Defect Dynamics and Twin-Layer Interactions in SiC Crystals through Molecular Simulations.

Liu, Guiyang; Gao, Tinghong; Huang, Jin; Yan, Wanjun; Xie, Quan; Xiao, Qingquan.

Afiliação

Liu G; Institute of Advanced Optoelectronic Materials and Technology, College of Big Data and Information Engineering, Guizhou University, Guiyang 550025, China.
Gao T; Institute of Advanced Optoelectronic Materials and Technology, College of Big Data and Information Engineering, Guizhou University, Guiyang 550025, China.
Huang J; Institute of Advanced Optoelectronic Materials and Technology, College of Big Data and Information Engineering, Guizhou University, Guiyang 550025, China.
Yan W; College of Electronic & Information Engineering, Anshun University, Anshun 56100, China.
Xie Q; Institute of Advanced Optoelectronic Materials and Technology, College of Big Data and Information Engineering, Guizhou University, Guiyang 550025, China.
Xiao Q; Institute of Advanced Optoelectronic Materials and Technology, College of Big Data and Information Engineering, Guizhou University, Guiyang 550025, China.

J Phys Chem B ; 128(32): 7848-7858, 2024 Aug 15.

Article em En | MEDLINE | ID: mdl-39086234

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article