RESUMEN
We report the fabrication and first demonstration of an electron beam position monitor for a dielectric microaccelerator. This device is fabricated on a fused silica substrate using standard optical lithography techniques and uses the radiated optical wavelength to measure the electron beam position with a resolution of 10 µm, or 7% of the electron beam spot size. This device also measures the electron beam spot size in one dimension.
RESUMEN
We present the first direct observation of a higher-order inverse-free-electron-laser (IFEL) interaction. Interaction at the fourth, fifth, and sixth harmonics is observed from an IFEL operating at 800 nm. The harmonic spacing, relative harmonic strength, and transverse beam overlap of the interaction are all in good agreement with tracking simulations.