RESUMEN
The process of multiple x-ray reflections in single crystals is presented as a tool for x-ray spectroscopy. Among the possible applications it is shown that monochromatic spatial resolution of the x-ray source may be obtained through this process. With this method the distribution of variously ionized ions in laser-produced plasmas may be determined. Absolute wavelength values of x-ray transitions can be obtained. The x-ray emission qualities of x-ray tubes can be determined.
RESUMEN
The focusing properties of very large (≈33 × 33 cm2) spherically and toroidally curved crystals with a radius of curvature of ≈10 m were determined numerically with an x-ray tracing code and are compared to those of cylindrically bent crystals. Large spherically and toroidally curved crystals are of interest for the diagnostic of future large tokamak fusion experiments and possibly for other extended x-ray sources. Compared with cylindrically bent crystals-which are now widely used for the plasma diagnostic in tokamak experiments, in particular, for Doppler-broadening measurements to determine the central ion temperature-2D-curved crystal spectrometers can provide a significant enhancement of the intensity due to the additional focusing of the sagittal rays.