Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization.

High-throughput grain mapping with sub-nanometer spatial resolution is demonstrated using scanning nanobeam electron diffraction (also known as 4D scanning transmission electron microscopy, or 4D-STEM) combined with high-speed direct-electron detection. An electron probe size down to 0.5 nm in diameter is used and the sample investigated is a gold­palladium nanoparticle catalyst. Computational analysis of the 4D-STEM data sets is performed using a disk registration algorithm to identify the diffraction peaks followed by feature learning to map the individual grains. Two unsupervised feature learning techniques are compared: principal component analysis (PCA) and non-negative matrix factorization (NNMF). The characteristics of the PCA versus NNMF output are compared and the potential of the 4D-STEM approach for statistical analysis of grain orientations at high spatial resolution is discussed.

Simultaneous Preparation of Multiple Polymer Brushes under Ambient Conditions using Microliter Volumes.

The fabrication of well-defined, multifunctional polymer brushes under ambient conditions is described. This facile method uses light-mediated, metal-free atom-transfer radical polymerization (ATRP) to grow polymer brushes with only microliter volumes required. Key to the success of this strategy is the dual action of N-phenylphenothiazine (PTH) as both an oxygen scavenger and polymerization catalyst. Use of simple glass cover slips results in a high degree of spatial and temporal control and allows for multiple polymer brushes to be grown simultaneously. The preparation of arbitrary 3D patterns and functional/emissive polymer brushes demonstrates the practicality and versatility of this novel strategy.

Cryogenic 4D-STEM analysis of an amorphous-crystalline polymer blend: Combined nanocrystalline and amorphous phase mapping.

Understanding and visualizing the heterogeneous structure of immiscible semicrystalline polymer systems is critical for optimizing their morphology and microstructure. We demonstrate a cryogenic 4D-STEM technique using a combination of amorphous radial profile mapping and correlative crystalline growth processing methods to map both the crystalline and amorphous phase distribution in an isotactic polypropylene (iPP)/ethylene-octene copolymer (EO) multilayer film with 5-nm step size. The resulting map shows a very sharp interface between the amorphous iPP and EO with no preferential crystalline structure near or at the interface, reinforcing the expected incompatibility and immiscibility of iPP and EO, which is a short-chain branched polyethylene. This technique provides a method for direct observation of interfacial structure in an unstained semicrystalline complex multicomponent system with a single cryogenic 4D-STEM dataset.

Semiquantitative Atomic Force Microscopy-Infrared Spectroscopy Analysis of Chemical Gradients in Silicone Optical Waveguides.

Crossing losses in silicone optical waveguides are related to the magnitude and spatial extent of the waveguide refractive index gradient. When processing conditions are altered, the refractive index gradient can vary substantially, even when the formulation remains constant. Controlling the refractive index gradient requires control of the concentration of small molecules present within the core and clad layers. Developing a fundamental understanding of how small molecule migration drives changes in crossing loss requires the ability to examine chemical functionality over small length scales, which is a natural fit for atomic force microscopy-infrared spectroscopy (AFM-IR). In this work, AFM-IR spectra from model bilayer stacks are initially examined to understand molecular migration that occurs from heating the core and clad layers. The results of these model studies are then applied to photopatterned waveguide builds, where structure-function relationships are constructed between values of crossing loss and the concentration of C-H and O-H functionalities present in the core and clad layers. Results show that small molecule evaporation and migration are competing processes that need to be controlled to minimize crossing loss.

Gallium, neon and helium focused ion beam milling of thin films demonstrated for polymeric materials: study of implantation artifacts.

Focused ion beam milling of ∼200 nm polymer thin films is investigated using a multibeam ion microscope equipped with a gallium liquid metal ion source and a helium/neon gas field-ionization source. The quality of gallium, neon, and helium ion milled edges in terms of ion implantation artifacts is analyzed using a combination of helium ion microscopy, transmission electron microscopy and light microscopy. Results for a synthetic polymer thin film, in the form of cryo-ultramicrotomed sections from a co-extruded polymer multilayer, and a biological polymer thin film, in the form of the base layer of a butterfly wing scale, are presented. While gallium and neon ion milling result in the implantation of ions up to tens of nanometers from the milled edge and local thinning near the edge, helium ion milling produces much sharper edges with dramatically reduced implantation. These effects can be understood in terms of the minimal lateral scatter and larger stopping distance of helium compared with the heavier ions, whereby due to the thin film geometry, most of the incident helium ions will pass straight through the material. The basic result demonstrated here for polymer thin films is also expected for thin films of hard materials such as metals and ceramics.