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1.
Phys Rev Lett ; 131(3): 036301, 2023 Jul 21.
Artículo en Inglés | MEDLINE | ID: mdl-37540856

RESUMEN

The largest Fermi surface sheet of the correlated metal Sr_{2}RuO_{4} can be driven through a Lifshitz transition between an electronlike and an open geometry by uniaxial stress applied along the [100] lattice direction. Here, we investigate the effect of this transition on the longitudinal resistivity ρ_{xx} and the Hall coefficient R_{H}. ρ_{xx}(T), when Sr_{2}RuO_{4} is tuned to this transition, is found to have a T^{2}logT form, as expected for a Fermi liquid tuned to a Lifshitz transition. R_{H} is found to become more negative as the Fermi surface transitions from an electronlike to an open geometry, opposite to general expectations from this change in topology. The magnitude of the change in R_{H} implies that scattering changes throughout the Brillouin zone, not just at the point in k space where the transition occurs. In a model of orbital-dependent scattering, the electron-electron scattering rate on sections of Fermi surface with xy orbital weight is found to decrease dramatically.

2.
Rev Sci Instrum ; 91(8): 083902, 2020 Aug 01.
Artículo en Inglés | MEDLINE | ID: mdl-32872945

RESUMEN

Response to uniaxial stress has become a major probe of electronic materials. Tunable uniaxial stress may be applied using piezoelectric actuators, and so far two methods have been developed to couple samples to actuators. In one, actuators apply force along the length of a free, beam-like sample, allowing very large strains to be achieved. In the other, samples are affixed directly to piezoelectric actuators, allowing the study of mechanically delicate materials. Here, we describe an approach that merges the two: thin samples are affixed to a substrate, which is then pressurized uniaxially using piezoelectric actuators. Using this approach, we demonstrate the application of large elastic strains to mechanically delicate samples: the van der Waals-bonded material FeSe and a sample of CeAuSb2 that was shaped with a focused ion beam.

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