Effective Size Reduction of the Metallic Waveguide Bandpass Filter with Metamaterial Resonators and Its 3D-Printed Version.

In this paper, a novel method is proposed to effectively reduce the size of a waveguide bandpass filter (BPF). Because the metallic cavities make the conventional waveguide end up with a large geometry, especially for high-order BPFs, very compact waveguide-type resonators having metamaterial zeroth-order resonance (WG ZOR) are designed on the cross section of the waveguide and substituted for the cavities. While the cavities are half-wavelength resonators, the WG ZOR is shorter than one-eighth of a wavelength. A substantial reduction in the size and weight of the waveguide filter is observed as the resonators are cascaded in series through coupling elements in the X-band that is much longer than that in K- or Ka-bands. The proposed metamaterial filter is realized as a 3D-printed structure to be lighter and thus more suitable for low earth orbit (LEO) satellites. An X-band of 7.25-7.75 GHz is chosen to verify the method as the passband with an attenuation of 40 dB at 7.00 GHz and 8.00 GHz as the roll-off in the stopband. The BPF is manufactured in two ways, namely the CNC-milling technique and metal coating-added 3D printing. The design is carried out with a geometrical parameter of not 10-2 mm but rather 10-1 mm, which is good for manufacturers but challenging for component designers. The measurement of the manufactured metal waveguide filters reveals that the passband has about ≤1 dB and ≤-15 dB as the insertion loss and the reflection coefficient, respectively, and the stopband has an attenuation of ≤-40 dB, which are in good agreement with the results of the circuit and the simulation. The proposed filter has a length of 14 cm as the eighth-order BPF, but the conventional waveguide is 20 cm as the seventh-order BPF for the same area of the cross section.

3D PEEK Objects Fabricated by Fused Filament Fabrication (FFF).

PEEK (poly ether ether ketone) materials printed using FFF 3D printing have been actively studied on applying electronic devices in satellites owing to their excellent light weight and thermal resistance. However, the PEEK FFF process generated cavities inside due to large shrinkage has degraded both mechanical integrity and printing reliability. Here, we have investigated the correlations between nozzle temperatures and PEEK printing behaviors such as the reliability of printed line width and surface roughness. As the temperature increased from 360 to 380 °C, the width of the printed line showed a tendency to decrease. However, the width of PEEK printed lines re-increased from 350 to 426 µm at the nozzle temperatures between 380 and 400 °C, associated with solid to liquid-like phase transition and printed out distorted and disconnected lines. The surface roughness of PEEK objects increased from 49 to 55 µm as the nozzle temperature increased from 380 to 400 °C, where PEEK is melted down and quickly solidified based on more energy and additional heating time at higher printing temperatures at 400 °C. Based on these printing trends, a reliability analysis of the printed line was performed. The printed line formed the most uniform width at 380 °C and had a highest Weibull coefficient of 28.6 using the reliability analysis technique called Weibull modulus.