New SnO2/MgAl-layered double hydroxide composites as photocatalysts for cationic dyes bleaching.

A new type of nanocomposite containing SnO(2) has been obtained by wet impregnation of dehydrated Mg/Al-hydrotalcite-type compounds with ethanolic solutions of SnCl(4).2H(2)O. Tin chloride hydrolysis was achieved using NaOH or NH(4)OH aqueous solutions, at pH around 9, followed by the conversion into corresponding hydroxides through calcinations. The powder X-ray diffraction (PXRD) and UV-Vis diffuse reflectance (UV-DR) methods confirmed the structure of as-synthesized solids. The chemical composition and morphology of the synthesized materials were investigated by energy dispersive X-ray analysis (EDX), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The as-synthesized materials were used for photocatalytic studies showing a good activity for methylene blue decolourization, which varies with SnO(2) content and used as a hydrolysing agent. The proposed mechanism is based on the shifting of flat band potential of SnO(2) due to the interaction with Mg/Al-LDH, this being energetically favourable to the formation of hydroxyl radicals responsible for methylene blue degradation.

Microstructural and chemical transformation of thin Ti/Pd and TiDy/Pd bilayer films induced by vacuum annealing.

Using a combination of scanning electron microscopy, transmission electron microscopy (TEM), X-ray diffraction and X-ray photoelectron spectroscopy (XPS), we made a comparative study of the high-temperature annealing impact on thin titanium deuteride (TiD(y)) films covered by an ultrathin Pd layer, and on Ti/Pd bilayer films. The bilayer films were prepared under ultrahigh vacuum conditions and were in situ annealed using the same annealing procedure. It was found that the surface and the bulk morphology of both films undergo different annealing-induced transformations, leading to an extensive intermixing between the Ti and Pd layers and the formation of a new PdTi(2) bimetallic phase. Energy-filtered TEM imaging and energy-dispersive X-ray spectrometry analysis, as well as XPS depth profiling all provided evidence of a different distribution of Pd and Ti in the annealed TiD(y)/Pd film compared with the annealed Ti/Pd film. Our results show that thermal decomposition of TiD(y), as a consequence of annealing the TiD(y)/Pd film, modifies the intermixing process, thereby promoting Ti diffusion into the Pd-rich top layer of the TiD(y) film and thus providing a more likely path for the formation of the PdTi(2) phase than in an annealed Ti/Pd film.

Structural and chemical characterisation of titanium deuteride films covered by nanoscale evaporated palladium layers.

Thin titanium deuteride (TiD(y)) films, covered by an ultra-thin palladium layer, have been compared with the corresponding titanium and palladium films using a combination of scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS). The TiD(y) layers were prepared under ultra-high vacuum (UHV) conditions by precisely controlled deuterium sorption at 298 K on a Ti film evaporated onto a Si(100) substrate. Both Ti and TiD(y) films were then covered in situ by a nanoscale Pd layer. It was found that a 10- to 12-nm-thick Pd layer protects the TiD(y) films efficiently against extensive air interaction. The morphology of both the surface and bulk Pd/TiD(y) (Ti) films have been observed using SEM and cross-sectional TEM analysis, respectively. A polycrystalline bulk morphology in both Ti and TiD(y) films accompanied by a fine-grained Pd surface was observed. High-magnification cross-sectional TEM images reveal the TiD(y) film to be plastically deformed leading to an increase in the roughness of the top Pd layer. Complex structures, including Moiré patterns, have been identified within the Pd/TiD(y) interface. The chemical nature of this interface has been analysed after partial sputtering of the Pd top layer using XPS. Besides TiD(y) and Pd, TiO and PdO were found to be the main chemical species in the interface region of the Pd/TiH(y) film. The XPS valence-band spectra of the Pd/TiD(y) interface reveal electronic features characteristic of a Pd-Ti bimetallic structure.