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1.
Opt Express ; 30(26): 46749-46761, 2022 Dec 19.
Artigo em Inglês | MEDLINE | ID: mdl-36558619

RESUMO

The influence of Mo interlayers on the microstructure of films and boundaries, and the reflective characteristics of Ru/Be multilayer mirrors (MLM) were studied by X-ray reflectometry and diffractometry, and secondary ion mass spectrometry (SIMS). An increase in the reflection coefficients of MLM at a wavelength of 11.4 nm to record values of R = 72.2% and FWHM to Δλ1/2 = 0.38 nm is shown. The effect of interlayers on the structural and reflective characteristics of MLM is explained by the barrier properties of the Mo layers, which prevent the mutual mixing of the Ru and Be layers, which leads to the formation of beryllides and a decrease in the X-ray optical contrast at the boundaries.

2.
Appl Opt ; 58(1): 21-28, 2019 Jan 01.
Artigo em Inglês | MEDLINE | ID: mdl-30645504

RESUMO

Aluminum thin-film spectral filters are widely used in telescopes for space observations of the Sun in the extreme ultraviolet range of wavelengths. The main purpose of film filters is to block radiation in the UV, visible, and near-IR spectral ranges. In connection with the development of new projects for the observation of the Sun from close distances, the thermal stability of the entrance film filter is an important characteristic. In this paper, the thermal stability of Al films with 2.5 nm thick MoSi2 protective cap layers has been studied. MoSi2 was chosen as a coating material because MoSi2 caps effectively protect the Al film from oxidation and simultaneously increase the mechanical strength of the Al film. Vacuum annealing of MoSi2/Al/MoSi2 films was carried out at temperatures up to 300°C. It has been demonstrated that at an annealing temperature of more than 200°C for 24 h, a noticeable decrease in the blocking properties of the MoSi2/Al/MoSi2 film is observed in the visible wavelength range, which is caused by the appearance of semi-transparent crystalline silicon dendritic structures that are tens of micrometers in size in the film. In the annealed area of the film specimen, the intermetallic Al12Mo phase was detected by electron diffraction structure analysis, indicating a possible reason for the appearance of silicon atoms needed for dendrite growth as a result of the chemical interaction of Al and MoSi2. Due to the requirements for a high degree of visible radiation blocking (106 to 107 times), the appearance of even one dendritic structure significantly reduces the blocking properties of the film filter and is, therefore, not permissible. Based on the measurement of the transmission of MoSi2-2.5 nm/Al-72 nm/MoSi2-2.5 nm films at 633 nm for isothermal annealing at 200°C-250°C, the activation energy for the formation of dendritic structures (E=1.55±0.1 eV) was measured and the maximum permissible film temperature (130°C) at which dendritic structures did not appear during a 5-year mission was predicted.

3.
J Xray Sci Technol ; 27(5): 857-870, 2019.
Artigo em Inglês | MEDLINE | ID: mdl-31282467

RESUMO

Anomalously high x-ray scattering at a wavelength of 0.154 nm by super-polished substrates of fused silica, which were etched by the argon ions with the energy of 300 eV, is detected. The scattering intensity increases monotonically with increasing of the etching depth. The effect is explained by the scattering on the volume inhomogeneities with the lateral size greater than 0.5 µm of the subsurface "damaged" layer. The concentration of volume inhomogeneities increases with the increase of the fluence of argon ions, but the concentration of implanted argon atoms in the layer quickly reaches the maximum value and then begins a trend of going down. The thickness of the "damaged" layer is approximately equal to the penetration depth of the Ar atoms and can be directly determined from the x-ray specular reflection. It is shown that the presence of volume inhomogeneities of the subsurface "damaged" layer does not affect the geometric roughness of the surface. The observed effect imposes limitations on the usage of grazing incidence x-ray optics without reflective coatings and of the diffuse x-ray scattering (DXRS) method for studying the substrate roughness. A new method that potentially enables to evaluate the applicability of the DXRS method in practice is proposed.


Assuntos
Argônio/química , Imagem Óptica/instrumentação , Dióxido de Silício/química , Difração de Raios X/instrumentação , Íons , Propriedades de Superfície
4.
Appl Opt ; 55(17): 4683-90, 2016 Jun 10.
Artigo em Inglês | MEDLINE | ID: mdl-27409026

RESUMO

Al, with a passband in the wavelength range of 17-60 nm, and Zr, with a passband in the wavelength range of 6.5-17 nm, thin films on a support grid or support membrane are frequently used as UV, visible, and near-IR blocking filters in solar observatories. Although they possess acceptable optical performance, these filters also have some shortcomings such as low mechanical strength and low resistance to oxidation. These shortcomings hinder meeting the requirements for filters of future telescopes. We propose multilayer thin film filters on the basis of Al, Zr, and other materials with improved characteristics. It was demonstrated that stretched multilayer films on a support grid with a mesh size up to 5 mm can withstand vibration loads occurring during spacecraft launch. A large mesh size is preferable for filters of high-resolution solar telescopes, since it allows image distortion caused by light diffraction on the support grid to be avoided. We have investigated the thermal stability of Al/Si and Zr/Si multilayers assuming their possible application as filters in the Intergelioprobe project, in which the observation of coronal plasma will take place close to the Sun. Zr/Si films show high thermal stability and may be used as blocking filters in the wavelength range of 12.5-17 nm. Al/Si films show lower thermal stability: a significant decrease in the film's transmission in the EUV spectral range and an increase in the visible spectrum have been observed. We suppose that the low thermal stability of Al/Si films restricts their application in the Intergelioprobe project. Thus, there is a lack of filters for the wavelength range of λ>17 nm. Be/Si and Cr/Si filters have been proposed for the wavelength range near 30.4 nm. Although these filters have lower transparency than Al/Si, they are superior in thermal stability. Multilayer Sc/Al filters with relatively high transmission at a wavelength of 58.4 nm (HeI line) and simultaneously sufficient rejection in the wavelength range near 30.4 nm (HeII line) have been fabricated. They are planned to be used in the project KORTES, whose telescopes will have an EUV channel at 58.4 nm.

5.
Materials (Basel) ; 16(3)2023 Jan 20.
Artigo em Inglês | MEDLINE | ID: mdl-36769972

RESUMO

This paper introduces the results of hydrolytic stability tests and radiation resistance tests of phosphate molybdates and phosphate tungstates Na1-xZr2(PO4)3-x(XO4)x, X = Mo, W (0 ≤ x ≤ 0.5). The ceramics characterized by relatively high density (more than 97.5%) were produced by spark plasma sintering (SPS) of submicron powders obtained by sol-gel synthesis. The study focused on hydrolytic resistance of the ceramics in static mode at room temperature. After 28 days of testing in distilled water, the normalized leaching rate was determined. It was found that the ceramics demonstrated high hydrolytic resistance in static mode: the normalized leaching rates for Mo- and W-containing ceramics were 31·10-6 and 3.36·10-6 g·cm-2·day-1, respectively. The ceramics demonstrated high resistance to irradiation with 167 MeV Xe+26 multiple-charged ions at fluences ranging from 1·1012 to 6·1013 cm-2. The Mo-containing Na0.5Zr2(PO4)2.5(XO4)0.5 ceramics were shown to have higher radiation resistance than phosphate tungstates. Radiation was shown to trigger an increase in leaching rates for W and Mo in the crystal structure of NZP ceramics.

6.
Nanotechnology ; 21(47): 475301, 2010 Nov 26.
Artigo em Inglês | MEDLINE | ID: mdl-21030764

RESUMO

Nanometer length-scale holes (nanopores) are often formed in amorphous materials for fundamental studies of molecular mass transport. In the current study, electron beam irradiation in the transmission electron microscope was used to form nanopores in a crystalline material (Si). Analysis of the nanopores showed that they are formed by knock-on of atoms by the high energy incident electron beam, and surface diffusion is partially responsible for the hour-glass shapes that are found for some nanopores. Energetically favorable three-dimensional shapes of nanopores were simulated, and the nanopores simulated in the model crystalline material were found to be more stable than the nanopores simulated in the amorphous material. The nanopore shape was also found to depend on the nanopore diameter-to-length ratio. Based on the above, we demonstrate the advantage in using a crystalline material for nanopore formation and show that control of the three-dimensional shape of nanopores formed by electron beam irradiation is possible.

7.
J Microsc ; 236(3): 165-73, 2009 Dec.
Artigo em Inglês | MEDLINE | ID: mdl-19941556

RESUMO

Transmission electron microscopy specimens in the form of elongated, conical needles were made using a dual-beam focused ion beam system, allowing the specimen thickness to be geometrically determined for a range of thickness values. From the same samples electron energy loss maps were acquired and the plasmon mean free path (lambda) for inelastic scattering was determined experimentally from the measured values of specimen thickness. To test the method lambda was determined for Ni (174 +/- 17 nm), alpha-Al(2)O(3) (143 +/- 14 nm), Si (199 +/- 20 nm) and amorphous SiO(2) (238 +/- 12 nm), and compared both to experimental values of lambda taken from the literature and to calculated values. The calculated values of lambda significantly underestimate the true sample thickness for high accelerating voltages (300 kV) and large collection angles. A linear dependence of lambda on thickness was confirmed for t/lambda < 0.5-0.6, but this method also provides an approach for calibrating lambda at sample thicknesses for which multiple scattering occurs, thus expanding the thickness range over which electron energy loss spectroscopy can be used to determine the absolute sample thickness (t/lambda > 0.6). The experimental method proposed in this contribution offers a means to calibrate lambda for any type of material or phase that can be milled using a focused ion beam system.

8.
Sud Med Ekspert ; 43(3): 23-8, 2000.
Artigo em Russo | MEDLINE | ID: mdl-11186950

RESUMO

A protocol for comparative analysis of heroin making use of chromatographic methods and infra-red spectroscopy is presented.


Assuntos
Heroína/análise , Papaver/química , Plantas Medicinais , Alcaloides/química , Cromatografia/métodos , Espectroscopia de Infravermelho com Transformada de Fourier/métodos
9.
Sud Med Ekspert ; 42(3): 23-30, 1999.
Artigo em Russo | MEDLINE | ID: mdl-10396963

RESUMO

Methods for analysis of narcotics belonging to amphetamine methylene dioxy derivatives (MDD) are reviewed. The characteristics of these agents, their metabolism, and methods used for their detection and identification (TLC, GC, HPLC, GC/MS) are described. Methods for their extraction from biological objects (human urine and hair) are described. Efficacy of MDMA and MDEA from the urine by different extractants is assessed. The data demonstrate different potentialities for detection and identification of amphetamine MDD, including those in biological specimens (human urine and hairs), by numerous chromatographic methods.


Assuntos
Anfetaminas/análise , Drogas Desenhadas/análise , Cromatografia Gasosa/métodos , Cromatografia Gasosa/estatística & dados numéricos , Cromatografia Líquida de Alta Pressão/métodos , Cromatografia Líquida de Alta Pressão/estatística & dados numéricos , Cromatografia Líquida/métodos , Cromatografia Líquida/estatística & dados numéricos , Cromatografia em Camada Fina/métodos , Cromatografia em Camada Fina/estatística & dados numéricos , Medicina Legal/métodos , Medicina Legal/estatística & dados numéricos , Cromatografia Gasosa-Espectrometria de Massas/métodos , Cromatografia Gasosa-Espectrometria de Massas/estatística & dados numéricos , Cabelo/química , Humanos , Soluções , Comprimidos , Urinálise/métodos , Urinálise/estatística & dados numéricos
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