Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of lambda/600.

We report a near-field optical microscopy experiment at lambda = 10.6 microm, using an apertureless metallic tip functioning simultaneously in the atomic force microscopy tapping mode. The 17-nm optical resolution (lambda/600) that we achieved confirms the validity and the potential of this concept for numerous applications.

Polarization effects in apertureless scanning near-field optical microscopy: an experimental study.

Strong electric-field enhancements at the apex of a tungsten tip illuminated by an external light source were recently predicted theoretically. We present an experimental study of the dependence of this effect on the polarization angle of the incident light. It is shown that the intensity of the light scattered by the tungsten tip of an apertureless scanning near-field optical microscope is 2 orders of magnitude higher when the incident light is p polarized than when it is s polarized. This experimental result is in good agreement with theoretical predictions and provides an easy way to test the quality of the tips.

Apertureless scanning near-field magneto-optical microscopy of magnetic multilayers.

We imaged magnetic domains in Pt/Co/Pt multilayers using an apertureless scanning near-field optical microscope operating in reflection mode. As the magneto-optical effects are weak for this kind of structure, a polarization modulation technique with a photoelastic modulator was used to reveal the contrast between magnetic domains. In the case of a Pt/Co/Pt trilayer structure, a strong improvement in lateral resolution is observed compared with far-field magneto-optical images and good sensitivity is achieved. In the case of a Pt/[Co/Pt]Pt multilayer structure, stripe domains of 200 nm width could be resolved, in good agreement with images obtained by magnetic force microscopy on the same structure.