On the use of QDE-SVM for gene feature selection and cell type classification from scRNA-seq data.

Cell type identification is one of the fundamental tasks in single-cell RNA sequencing (scRNA-seq) studies. It is a key step to facilitate downstream interpretations such as differential expression, trajectory inference, etc. scRNA-seq data contains technical variations that could affect the interpretation of the cell types. Therefore, gene selection, also known as feature selection in data science, plays an important role in selecting informative genes for scRNA-seq cell type identification. Generally speaking, feature selection methods are categorized into filter-, wrapper-, and embedded-based approaches. From the existing literature, methods from filter- and embedded-based approaches are widely applied in scRNA-seq gene selection tasks. The wrapper-based method that gives promising results in other fields has yet been extensively utilized for selecting gene features from scRNA-seq data; in addition, most of the existing wrapper methods used in this field are clustering instead of classification-based. With a large number of annotated data available today, this study applied a classification-based approach as an alternative to the clustering-based wrapper method. In our work, a quantum-inspired differential evolution (QDE) wrapped with a classification method was introduced to select a subset of genes from twelve well-known scRNA-seq transcriptomic datasets to identify cell types. In particular, the QDE was combined with different machine-learning (ML) classifiers namely logistic regression, decision tree, support vector machine (SVM) with linear and radial basis function kernels, as well as extreme learning machine. The linear SVM wrapped with QDE, namely QDE-SVM, was chosen by referring to the feature selection results from the experiment. QDE-SVM showed a superior cell type classification performance among QDE wrapping with other ML classifiers as well as the recent wrapper methods (i.e., FSCAM, SSD-LAHC, MA-HS, and BSF). QDE-SVM achieved an average accuracy of 0.9559, while the other wrapper methods achieved average accuracies in the range of 0.8292 to 0.8872.

Evolutionary fuzzy ARTMAP neural networks for classification of semiconductor defects.

Wafer defect detection using an intelligent system is an approach of quality improvement in semiconductor manufacturing that aims to enhance its process stability, increase production capacity, and improve yields. Occasionally, only few records that indicate defective units are available and they are classified as a minority group in a large database. Such a situation leads to an imbalanced data set problem, wherein it engenders a great challenge to deal with by applying machine-learning techniques for obtaining effective solution. In addition, the database may comprise overlapping samples of different classes. This paper introduces two models of evolutionary fuzzy ARTMAP (FAM) neural networks to deal with the imbalanced data set problems in a semiconductor manufacturing operations. In particular, both the FAM models and hybrid genetic algorithms are integrated in the proposed evolutionary artificial neural networks (EANNs) to classify an imbalanced data set. In addition, one of the proposed EANNs incorporates a facility to learn overlapping samples of different classes from the imbalanced data environment. The classification results of the proposed evolutionary FAM neural networks are presented, compared, and analyzed using several classification metrics. The outcomes positively indicate the effectiveness of the proposed networks in handling classification problems with imbalanced data sets.

On Equivalence of FIS and ELM for Interpretable Rule-Based Knowledge Representation.

This paper presents a fuzzy extreme learning machine (F-ELM) that embeds fuzzy membership functions and rules into the hidden layer of extreme learning machine (ELM). Similar to the concept of ELM that employed the random initialization technique, three parameters of F-ELM are randomly assigned. They are the standard deviation of the membership functions, matrix-C (rule-combination matrix), and matrix-D [don't care (DC) matrix]. Fuzzy if-then rules are formulated by the rule-combination Matrix of F-ELM, and a DC approach is adopted to minimize the number of input attributes in the rules. Furthermore, F-ELM utilizes the output weights of the ELM to form the target class and confidence factor for each of the rules. This is to indicate that the corresponding consequent parameters are determined analytically. The operations of F-ELM are equivalent to a fuzzy inference system. Several benchmark data sets and a real world fault detection and diagnosis problem have been used to empirically evaluate the efficacy of the proposed F-ELM in handling pattern classification tasks. The results show that the accuracy rates of F-ELM are comparable (if not superior) to ELM with distinctive ability of providing explicit knowledge in the form of interpretable rule base.