Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination. | Ultramicroscopy;111(2): 149-54, 2011 Jan. | MEDLINE

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Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination.

Valamanesh, M; Langlois, C; Alloyeau, D; Lacaze, E; Ricolleau, C.

Affiliation

Valamanesh M; Laboratoire Matériaux et Phénomènes Quantiques, CNRS-UMR 7162, Université Paris Diderot--Paris 7, Case Courrier 7021, 75205 Paris Cedex 13, France.

Ultramicroscopy ; 111(2): 149-54, 2011 Jan.

Article in En | MEDLINE | ID: mdl-21185459

Subject(s)

Microscopy, Electron, Transmission/methods; Moire Topography/methods; Nanoparticles/analysis; Crystallography; Image Processing, Computer-Assisted

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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Moire Topography / Microscopy, Electron, Transmission / Nanoparticles Language: En Journal: Ultramicroscopy Year: 2011 Type: Article Affiliation country: France

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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Moire Topography / Microscopy, Electron, Transmission / Nanoparticles Language: En Journal: Ultramicroscopy Year: 2011 Type: Article Affiliation country: France