Use of permanent marker to deposit a protection layer against FIB damage in TEM specimen preparation. | J Microsc;255(3): 180-7, 2014 Sep. | MEDLINE

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Use of permanent marker to deposit a protection layer against FIB damage in TEM specimen preparation.

Park, Y C; Park, B C; Romankov, S; Park, K J; Yoo, J H; Lee, Y B; Yang, J-M.

Affiliation

Park YC; National Nanofab Center (NNFC), Daejeon, South Korea.

J Microsc ; 255(3): 180-7, 2014 Sep.

Article in En | MEDLINE | ID: mdl-24957186

Key words

Direct writing; FIB; TEM; permanent marker deposition; protection layer; specimen preparation

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: J Microsc Year: 2014 Type: Article Affiliation country: South Korea

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: J Microsc Year: 2014 Type: Article Affiliation country: South Korea