In situ transmission electron microscopy of transistor operation and failure.

Wang, Baoming; Islam, Zahabul; Haque, Aman; Chabak, Kelson; Snure, Michael; Heller, Eric; Glavin, Nicholas

Wang, Baoming; Islam, Zahabul; Haque, Aman; Chabak, Kelson; Snure, Michael; Heller, Eric; Glavin, Nicholas.

Affiliation

Wang B; Department of Mechanical and Nuclear Engineering, The Pennsylvania State University, University Park, PA 16802, United States of America. Materials Research Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139, United States of America.

Nanotechnology ; 29(31): 31LT01, 2018 Aug 03.

Article in En | MEDLINE | ID: mdl-29770776

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2018 Type: Article Affiliation country: United States

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2018 Type: Article Affiliation country: United States