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Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment.
Chen, Hong-Chih; Kuo, Chuan-Wei; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Po-Hsun; Chen, Guan-Fu; Huang, Shin-Ping; Chen, Jian-Jie; Zhou, Kuan-Ju; Shih, Chih-Cheng; Tsao, Yu-Ching; Huang, Hui-Chun; Sze, Simon M.
Affiliation
  • Chen HC; Department of Photonics , National Cheng Kung University , Tainan 701 , Taiwan , R. O. C.
  • Lai WC; Department of Photonics , National Cheng Kung University , Tainan 701 , Taiwan , R. O. C.
  • Chen PH; Department of Applied Science , Naval Academy , Kaohsiung 813 , Taiwan , R. O. C.
  • Sze SM; Department of Electronics Engineering , National Chiao Tung University , Hsinchu 300 , Taiwan , R. O. C.
ACS Appl Mater Interfaces ; 11(43): 40196-40203, 2019 Oct 30.
Article in En | MEDLINE | ID: mdl-31573173
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: ACS Appl Mater Interfaces Journal subject: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Year: 2019 Type: Article
Fulltext
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: ACS Appl Mater Interfaces Journal subject: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Year: 2019 Type: Article