Fabrication of a fractal pattern device for focus characterizations of X-ray imaging systems by Si deep reactive ion etching and bottom-up Au electroplating.
Appl Opt
; 61(13): 3850-3854, 2022 May 01.
Article
in En
| MEDLINE
| ID: mdl-36256429
Full text:
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Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Appl Opt
Year:
2022
Type:
Article