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Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning.
Pham, Thi Tram Anh; Thoi, Do Kieu Trang; Choi, Hyohoon; Park, Suhyun.
Affiliation
  • Pham TTA; Department of Electronic and Electrical Engineering, Ewha Womans University, Seoul 03760, Republic of Korea.
  • Thoi DKT; Department of Electronic and Electrical Engineering, Ewha Womans University, Seoul 03760, Republic of Korea.
  • Choi H; Pixel Inc., Pyeongtaek 17708, Republic of Korea.
  • Park S; Department of Electronic and Electrical Engineering, Ewha Womans University, Seoul 03760, Republic of Korea.
Sensors (Basel) ; 23(6)2023 Mar 19.
Article in En | MEDLINE | ID: mdl-36991958
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Sensors (Basel) Year: 2023 Type: Article
Fulltext
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PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Sensors (Basel) Year: 2023 Type: Article