Beam diameter thresholds as applying light depolarization for effective submicron and micron root-mean-square roughness evaluation: erratum.
Appl Opt
; 57(24): 7081, 2018 08 20.
Article
en En
| MEDLINE
| ID: mdl-30129603
In connection with our recently published article Appl. Opt.56, 7024 (2017)APOPAI0003-693510.1364/AO.56.007024, a simple but important correction is presented.
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Colección:
01-internacional
Banco de datos:
MEDLINE
Idioma:
En
Revista:
Appl Opt
Año:
2018
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Article