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Quantitative EMCD by use of a double aperture for simultaneous acquisition of EELS.
Ali, Hasan; Warnatz, Tobias; Xie, Ling; Hjörvarsson, Björgvin; Leifer, Klaus.
Afiliación
  • Ali H; Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, Uppsala 75121, Sweden.
  • Warnatz T; Department of Physics and Astronomy, Uppsala University, Box 516, Uppsala 75120, Sweden.
  • Xie L; Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, Uppsala 75121, Sweden.
  • Hjörvarsson B; Department of Physics and Astronomy, Uppsala University, Box 516, Uppsala 75120, Sweden.
  • Leifer K; Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, Uppsala 75121, Sweden. Electronic address: klaus.leifer@angstrom.uu.se.
Ultramicroscopy ; 196: 192-196, 2019 01.
Article en En | MEDLINE | ID: mdl-30439606

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2019 Tipo del documento: Article País de afiliación: Suecia

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2019 Tipo del documento: Article País de afiliación: Suecia