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In-Plane Optical and Electrical Anisotropy of 2D Black Arsenic.
Zhong, Mianzeng; Meng, Haotong; Liu, Sijie; Yang, Huai; Shen, Wanfu; Hu, Chunguang; Yang, Juehan; Ren, Zhihui; Li, Bo; Liu, Yunyan; He, Jun; Xia, Qinglin; Li, Jingbo; Wei, Zhongming.
Afiliación
  • Zhong M; Hunan Key Laboratory of Super-microstructure and Ultrafast Process, School of Physics and Electronics, Central South University, Changsha 410083, Hunan, China.
  • Meng H; Hunan Key Laboratory of Super-microstructure and Ultrafast Process, School of Physics and Electronics, Central South University, Changsha 410083, Hunan, China.
  • Liu S; Hunan Key Laboratory of Super-microstructure and Ultrafast Process, School of Physics and Electronics, Central South University, Changsha 410083, Hunan, China.
  • Yang H; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences & Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100083, China.
  • Shen W; State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China.
  • Hu C; State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China.
  • Yang J; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences & Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100083, China.
  • Ren Z; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences & Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100083, China.
  • Li B; Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, Hunan, China.
  • Liu Y; School of Physics and Optoelectronic Engineering, Shandong University of Technology, Zibo 255049, Shandong, China.
  • He J; Hunan Key Laboratory of Super-microstructure and Ultrafast Process, School of Physics and Electronics, Central South University, Changsha 410083, Hunan, China.
  • Xia Q; Hunan Key Laboratory of Super-microstructure and Ultrafast Process, School of Physics and Electronics, Central South University, Changsha 410083, Hunan, China.
  • Li J; Institute of Semiconductors, South China Normal University, Guangzhou 510631, China.
  • Wei Z; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences & Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100083, China.
ACS Nano ; 15(1): 1701-1709, 2021 Jan 26.
Article en En | MEDLINE | ID: mdl-33331154

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: ACS Nano Año: 2021 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: ACS Nano Año: 2021 Tipo del documento: Article País de afiliación: China