Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source.
J Synchrotron Radiat
; 28(Pt 6): 1786-1800, 2021 Nov 01.
Article
en En
| MEDLINE
| ID: mdl-34738932
ABSTRACT
In the last two decades, far-field high-energy diffraction microscopy (FF-HEDM) and similar non-destructive techniques have been actively developed at synchrotron light sources around the world. As these techniques (and associated analysis tools) are becoming more available for the general users of these light sources, it is important and timely to characterize their performance and capabilities. In this work, the FF-HEDM instrument implemented at the 1-ID-E endstation of the Advanced Photon Source (APS) is summarized. The set of measurements conducted to characterize the instrument's repeatability and sensitivity to changes in grain orientation and position are also described. When an appropriate grain matching method is used, the FF-HEDM instrument's repeatability is approximately 5â
µm in translation, 0.02° in rotation, and 2â
×â
10-4 in strain; the instrument sensitivity is approximately 5â
µm in translation and 0.05° in rotation.
Texto completo:
1
Colección:
01-internacional
Banco de datos:
MEDLINE
Tipo de estudio:
Diagnostic_studies
Idioma:
En
Revista:
J Synchrotron Radiat
Asunto de la revista:
RADIOLOGIA
Año:
2021
Tipo del documento:
Article
País de afiliación:
Estados Unidos