Statistical signature of electrobreakdown in graphene nanojunctions.

Evangeli, Charalambos; Tewari, Sumit; Kruip, Jonathan Marcell; Bian, Xinya; Swett, Jacob L; Cully, John; Thomas, James; Briggs, G Andrew D; Mol, Jan A

Evangeli, Charalambos; Tewari, Sumit; Kruip, Jonathan Marcell; Bian, Xinya; Swett, Jacob L; Cully, John; Thomas, James; Briggs, G Andrew D; Mol, Jan A.

Afiliación

Evangeli C; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.
Tewari S; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.
Kruip JM; School of Physics and Astronomy, Queen Mary University of London, London E1 4NS, United Kingdom.
Bian X; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.
Swett JL; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.
Cully J; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.
Thomas J; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.
Briggs GAD; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.
Mol JA; School of Physics and Astronomy, Queen Mary University of London, London E1 4NS, United Kingdom.

Proc Natl Acad Sci U S A ; 119(27): e2119015119, 2022 Jul 05.

Article en En | MEDLINE | ID: mdl-35759664

Palabras clave

electrobreakdown; graphene; resistive switching; statistics; vacuum

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Proc Natl Acad Sci U S A Año: 2022 Tipo del documento: Article País de afiliación: Reino Unido

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