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Direct high-resolution X-ray imaging exploiting pseudorandomness.
Lee, KyeoReh; Lim, Jun; Lee, Su Yong; Park, YongKeun.
Afiliación
  • Lee K; Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon, 34141, Republic of Korea. kyeo@kaist.ac.kr.
  • Lim J; KAIST Institute for Health Science and Technology, Korea Advanced Institute of Science and Technology, Daejeon, 34141, Republic of Korea. kyeo@kaist.ac.kr.
  • Lee SY; Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, Kyungbuk, 37637, Republic of Korea. limjun@postech.ac.kr.
  • Park Y; Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, Kyungbuk, 37637, Republic of Korea.
Light Sci Appl ; 12(1): 88, 2023 Apr 06.
Article en En | MEDLINE | ID: mdl-37024454
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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Light Sci Appl Año: 2023 Tipo del documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Light Sci Appl Año: 2023 Tipo del documento: Article