Full-field hard X-ray nano-tomography at SSRF.
J Synchrotron Radiat
; 30(Pt 4): 815-821, 2023 Jul 01.
Article
en En
| MEDLINE
| ID: mdl-37145138
ABSTRACT
An in-house designed transmission X-ray microscopy (TXM) instrument has been developed and commissioned at beamline BL18B of the Shanghai Synchrotron Radiation Facility (SSRF). BL18B is a hard (5-14â
keV) X-ray bending-magnet beamline recently built with sub-20â
nm spatial resolution in TXM. There are two kinds of resolution mode one based on using a high-resolution-based scintillator-lens-coupled camera, and the other on using a medium-resolution-based X-ray sCMOS camera. Here, a demonstration of full-field hard X-ray nano-tomography for high-Z material samples (e.g. Au particles, battery particles) and low-Z material samples (e.g. SiO2 powders) is presented for both resolution modes. Sub-50â
nm to 100â
nm resolution in three dimensions (3D) has been achieved. These results represent the ability of 3D non-destructive characterization with nano-scale spatial resolution for scientific applications in many research fields.
Palabras clave
Texto completo:
1
Colección:
01-internacional
Banco de datos:
MEDLINE
Asunto principal:
Sincrotrones
/
Dióxido de Silicio
País/Región como asunto:
Asia
Idioma:
En
Revista:
J Synchrotron Radiat
Asunto de la revista:
RADIOLOGIA
Año:
2023
Tipo del documento:
Article