Your browser doesn't support javascript.
loading
Free light-shape focusing in extreme-ultraviolet radiation with self-evolutionary photon sieves.
Cui, Huaiyu; Zhang, Xiuping; Li, You; Zhao, Dongdi; Zhang, Junyong; Zhao, Yongpeng.
Afiliación
  • Cui H; National Key Laboratory of Science and Technology On Tunable Laser, Harbin Institute of Technology, Harbin, China.
  • Zhang X; Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China.
  • Li Y; Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China.
  • Zhao D; National Key Laboratory of Science and Technology On Tunable Laser, Harbin Institute of Technology, Harbin, China.
  • Zhang J; Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China. zhangjy829@siom.ac.cn.
  • Zhao Y; National Key Laboratory of Science and Technology On Tunable Laser, Harbin Institute of Technology, Harbin, China. zhaoyp3@hit.edu.cn.
Sci Rep ; 14(1): 1675, 2024 Jan 19.
Article en En | MEDLINE | ID: mdl-38243046
ABSTRACT
Extreme-ultraviolet (EUV) radiation is a promising tool, not only for probing microscopic activities but also for processing nanoscale structures and performing high-resolution imaging. In this study, we demonstrate an innovative method to generate free light-shape focusing with self-evolutionary photon sieves under a single-shot coherent EUV laser; this includes vortex focus shaping, array focusing, and structured-light shaping. The results demonstrate that self-evolutionary photon sieves, consisting of a large number of specific pinholes fabricated on a piece of Si3N4 membrane, are capable of freely regulating an EUV light field, for which high-performance focusing elements are extremely lacking, let alone free light-shape focusing. Our proposed versatile photon sieves are a key breakthrough in focusing technology in the EUV region and pave the way for high-resolution soft X-ray microscopy, spectroscopy in materials science, shorter lithography, and attosecond metrology in next-generation synchrotron radiation and free-electron lasers.

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2024 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2024 Tipo del documento: Article País de afiliación: China