Extending Copper Interconnects and Epoxy Dielectrics to Multi-GHz Frequencies.
IEEE Trans Compon Packaging Manuf Technol
; 14(6): 984-992, 2024 Jun.
Article
en En
| MEDLINE
| ID: mdl-39309372
ABSTRACT
Future multichip packages require Die-to-Die (D2D) interconnects operating at frequencies above 10 GHz; however, the extension of copper interconnects and epoxy dielectrics presents a trade-off between performance and reliability. This paper explores insertion losses and adhesion as a function of interface roughness at frequencies up to 18 GHz. We probe epoxy surface chemistry as a function of curing time and use wet etching to modulate surface roughness. The morphology is quantified by atomic force microscopy (AFM) and two-dimensional fast Fourier transform (2D FFT). Peel test and vector network analysis are used to examine the impacts of both type and level of roughness. The trade-offs between power efficiency and reliability are presented and discussed.
Texto completo:
1
Colección:
01-internacional
Banco de datos:
MEDLINE
Idioma:
En
Revista:
IEEE Trans Compon Packaging Manuf Technol
Año:
2024
Tipo del documento:
Article