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A history of scanning electron microscopy developments: towards "wet-STEM" imaging.
Bogner, A; Jouneau, P-H; Thollet, G; Basset, D; Gauthier, C.
Afiliação
  • Bogner A; Groupe d'Etudes de Métallurgie Physique et de Physique des Matériaux, UMR CNRS 5510, INSA de Lyon, Bâtiment B. Pascal, 7 Avenue Jean Capelle, 69621 Villeurbanne Cedex, France. Agnes.Bogner@insa-lyon.fr
Micron ; 38(4): 390-401, 2007.
Article em En | MEDLINE | ID: mdl-16990007
ABSTRACT
A recently developed imaging mode called "wet-STEM" and new developments in environmental scanning electron microscopy (ESEM) allows the observation of nano-objects suspended in a liquid phase, with a few manometers resolution and a good signal to noise ratio. The idea behind this technique is simply to perform STEM-in-SEM, that is SEM in transmission mode, in an environmental SEM. The purpose of the present contribution is to highlight the main advances that contributed to development of the wet-STEM technique. Although simple in principle, the wet-STEM imaging mode would have been limited before high brightness electron sources became available, and needed some progresses and improvements in ESEM. This new technique extends the scope of SEM as a high-resolution microscope, relatively cheap and widely available imaging tool, for a wider variety of samples.
Assuntos
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Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Microscopia Eletrônica de Varredura / Microscopia Eletrônica de Transmissão e Varredura Idioma: En Revista: Micron Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2007 Tipo de documento: Article País de afiliação: França
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Microscopia Eletrônica de Varredura / Microscopia Eletrônica de Transmissão e Varredura Idioma: En Revista: Micron Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2007 Tipo de documento: Article País de afiliação: França