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Growth and large-scale assembly of InAs/InP core/shell nanowire: effect of shell thickness on electrical characteristics.
Liu, Xueyu; Liu, Pengbo; Huang, Hui; Chen, Changxin; Jin, Tiening; Zhang, Yafei; Huang, Xianliang; Jin, Zhiyuan; Li, Xiaogan; Tang, Zhenan.
Afiliação
  • Liu X; Department of Electronic Science and Technology, Faculty of Electronic Information and Electrical Engineering, Dalian University of Technology, Dalian 116024, People's Republic of China.
Nanotechnology ; 24(24): 245306, 2013 Jun 21.
Article em En | MEDLINE | ID: mdl-23702835
ABSTRACT
InAs/InP core/shell nanowires with different shell thicknesses were grown by a two-step method, and large-scale assembly of single nanowire was realized by using dielectrophoresis alignment and patterned grooves. Thousands of single nanowire field-effect transistors were fabricated on a single chip. The effect of InP shell thickness on the electron mobility and density of InAs nanowires are experimentally investigated and discussed.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2013 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2013 Tipo de documento: Article