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Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation.
Lu, L; Fan, D; Bie, B X; Ran, X X; Qi, M L; Parab, N; Sun, J Z; Liao, H J; Hudspeth, M C; Claus, B; Fezzaa, K; Sun, T; Chen, W; Gong, X L; Luo, S N.
Afiliação
  • Lu L; CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei, Anhui 230027, People's Republic of China.
  • Fan D; The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207, People's Republic of China.
  • Bie BX; The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207, People's Republic of China.
  • Ran XX; School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, People's Republic of China.
  • Qi ML; School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, People's Republic of China.
  • Parab N; School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907, USA.
  • Sun JZ; School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907, USA.
  • Liao HJ; School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907, USA.
  • Hudspeth MC; School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907, USA.
  • Claus B; School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907, USA.
  • Fezzaa K; Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
  • Sun T; Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
  • Chen W; School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907, USA.
  • Gong XL; CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei, Anhui 230027, People's Republic of China.
  • Luo SN; The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207, People's Republic of China.
Rev Sci Instrum ; 85(7): 076101, 2014 Jul.
Article em En | MEDLINE | ID: mdl-25085186
ABSTRACT
We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2014 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2014 Tipo de documento: Article