Using X-mode L, R and O-mode reflectometry cutoffs to measure scrape-off-layer density profiles for upgraded ORNL reflectometer on NSTX-U.

Lau, C; Wilgen, J B; Caughman, J B; Hanson, G R; Hosea, J; Perkins, R; Ryan, P M; Taylor, G

Lau, C; Wilgen, J B; Caughman, J B; Hanson, G R; Hosea, J; Perkins, R; Ryan, P M; Taylor, G.

Afiliação

Lau C; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Wilgen JB; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Caughman JB; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Hanson GR; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Hosea J; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Perkins R; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Ryan PM; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Taylor G; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.

Rev Sci Instrum ; 85(11): 11D815, 2014 Nov.

Article em En | MEDLINE | ID: mdl-25430228

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Estados Unidos

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