Electric field breakdown in single molecule junctions.

Li, Haixing; Su, Timothy A; Zhang, Vivian; Steigerwald, Michael L; Nuckolls, Colin; Venkataraman, Latha

Li, Haixing; Su, Timothy A; Zhang, Vivian; Steigerwald, Michael L; Nuckolls, Colin; Venkataraman, Latha.

Afiliação

Li H; Department of Applied Physics and Applied Mathematics and Department of Chemistry, Columbia University, New York, New York 10027, United States.
Su TA; Department of Applied Physics and Applied Mathematics and Department of Chemistry, Columbia University, New York, New York 10027, United States.
Zhang V; Department of Applied Physics and Applied Mathematics and Department of Chemistry, Columbia University, New York, New York 10027, United States.
Steigerwald ML; Department of Applied Physics and Applied Mathematics and Department of Chemistry, Columbia University, New York, New York 10027, United States.
Nuckolls C; Department of Applied Physics and Applied Mathematics and Department of Chemistry, Columbia University, New York, New York 10027, United States.
Venkataraman L; Department of Applied Physics and Applied Mathematics and Department of Chemistry, Columbia University, New York, New York 10027, United States.

J Am Chem Soc ; 137(15): 5028-33, 2015 Apr 22.

Article em En | MEDLINE | ID: mdl-25675085

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Am Chem Soc Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google