Strain study of gold nanomaterials as HR-TEM calibration standard.

Peng, X Y; Zhou, L Q; Li, X; Tao, X F; Ren, L L; Cao, W H; Xu, G F

Peng, X Y; Zhou, L Q; Li, X; Tao, X F; Ren, L L; Cao, W H; Xu, G F.

Afiliação

Peng XY; School of Materials Science and Engineering, Central South University, Changsha 410083, China.
Zhou LQ; School of Materials Science and Engineering, Central South University, Changsha 410083, China.
Li X; Division of Nano Metrology and Materials Measurement, National Institute of Metrology, Beijing 100029, China. Electronic address: lixvaaaa@163.com.
Tao XF; Division of Nano Metrology and Materials Measurement, National Institute of Metrology, Beijing 100029, China.
Ren LL; Division of Nano Metrology and Materials Measurement, National Institute of Metrology, Beijing 100029, China. Electronic address: li-xu@nim.ac.cn.
Cao WH; Division of Electricity and Magnetism, National Institute of Metrology, Beijing 100029, China.
Xu GF; School of Materials Science and Engineering, Central South University, Changsha 410083, China.

Micron ; 79: 46-52, 2015 Dec.

Article em En | MEDLINE | ID: mdl-26342191

Palavras-chave

Geometric phase analysis; Gold thin film; High resolution electron microscopy; Interplanar spacing; Strain

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Micron Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2015 Tipo de documento: Article País de afiliação: China

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