Wavefront measurement made by an off-the-shelf laser-scanning pico projector.
Appl Opt
; 54(28): E235-40, 2015 Oct 01.
Article
em En
| MEDLINE
| ID: mdl-26479659
ABSTRACT
Focal plane testing methods such as the Shack-Hartmann wavefront sensor and phase-shifting deflectometry are valuable tools for optical testing. In this study, we propose a novel wavefront slope testing method that uses a scanning galvo laser, in which a single-mode Gaussian beam scans the pupils of the tested optics in the system. In addition, the ray aberration is reconstructed by the four-step phase-shifting measurement by modulating the angular domain. The measured wavefront is verified by a Fizeau interferometer in terms of Zernike polynomials.
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Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
Appl Opt
Ano de publicação:
2015
Tipo de documento:
Article