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Role of Remote Interfacial Phonon (RIP) Scattering in Heat Transport Across Graphene/SiO2 Interfaces.
Koh, Yee Kan; Lyons, Austin S; Bae, Myung-Ho; Huang, Bin; Dorgan, Vincent E; Cahill, David G; Pop, Eric.
Afiliação
  • Koh YK; Department of Mechanical Engineering, and Centre for Advanced 2D Materials, National University of Singapore , Singapore 119077.
  • Lyons AS; Department of Electrical and Computer Engineering, Micro and Nanotechnology Lab, University of Illinois , Urbana, Illinois 61801, United States.
  • Bae MH; Department of Electrical and Computer Engineering, Micro and Nanotechnology Lab, University of Illinois , Urbana, Illinois 61801, United States.
  • Huang B; Korea Research Institute of Standards and Science , Daejeon 305-340, Republic of Korea.
  • Dorgan VE; Department of Mechanical Engineering, and Centre for Advanced 2D Materials, National University of Singapore , Singapore 119077.
  • Cahill DG; Department of Electrical and Computer Engineering, Micro and Nanotechnology Lab, University of Illinois , Urbana, Illinois 61801, United States.
  • Pop E; Department of Materials Science and Engineering, and Frederick Seitz Materials Research Laboratory, University of Illinois , Urbana, Illinois 61801, United States.
Nano Lett ; 16(10): 6014-6020, 2016 10 12.
Article em En | MEDLINE | ID: mdl-27585088
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2016 Tipo de documento: Article
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2016 Tipo de documento: Article