Atom-counting in High Resolution Electron Microscopy:TEM or STEM - That's the question.

Gonnissen, J; De Backer, A; den Dekker, A J; Sijbers, J; Van Aert, S

Gonnissen, J; De Backer, A; den Dekker, A J; Sijbers, J; Van Aert, S.

Afiliação

Gonnissen J; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
De Backer A; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
den Dekker AJ; iMinds-Vision Lab, University of Antwerp, Universiteitsplein 1, 2610 Wilrijk, Belgium; Delft Center for Systems and Control (DCSC), Delft University of Technology, Mekelweg 2, 2628 CD Delft, The Netherlands.
Sijbers J; iMinds-Vision Lab, University of Antwerp, Universiteitsplein 1, 2610 Wilrijk, Belgium.
Van Aert S; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. Electronic address: sandra.vanaert@uantwerpen.be.

Ultramicroscopy ; 174: 112-120, 2017 03.

Article em En | MEDLINE | ID: mdl-28278434

Palavras-chave

Data processing/image processing; Electron microscope design and characterisation; High-resolution (scanning) transmission electron microscopy (HR (S)TEM)

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Guideline / Prognostic_studies Idioma: En Revista: Ultramicroscopy Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Bélgica

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google