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High photon-to-heat conversion efficiency in the wavelength region of 250-1200 nm based on a thermoelectric Bi2Te3 film structure.
Hu, Er-Tao; Yao, Yuan; Zang, Kai-Yan; Liu, Xin-Xing; Jiang, An-Qing; Zheng, Jia-Jin; Yu, Ke-Han; Wei, Wei; Zheng, Yu-Xiang; Zhang, Rong-Jun; Wang, Song-You; Zhao, Hai-Bin; Yoshie, Osamu; Lee, Young-Pak; Wang, Cai-Zhuang; Lynch, David W; Guo, Jun-Peng; Chen, Liang-Yao.
Afiliação
  • Hu ET; School of Optoelectronic Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China.
  • Yao Y; Department of Optical Science and Engineering, Fudan University, Shanghai, China.
  • Zang KY; Department of Optical Science and Engineering, Fudan University, Shanghai, China.
  • Liu XX; Department of Optical Science and Engineering, Fudan University, Shanghai, China.
  • Jiang AQ; School of Optoelectronic Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China.
  • Zheng JJ; Graduate School of IPS, Waseda University, Fukuoka, Japan.
  • Yu KH; School of Optoelectronic Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China.
  • Wei W; School of Optoelectronic Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China.
  • Zheng YX; School of Optoelectronic Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China.
  • Zhang RJ; Department of Optical Science and Engineering, Fudan University, Shanghai, China.
  • Wang SY; Department of Optical Science and Engineering, Fudan University, Shanghai, China.
  • Zhao HB; Department of Optical Science and Engineering, Fudan University, Shanghai, China.
  • Yoshie O; Department of Optical Science and Engineering, Fudan University, Shanghai, China.
  • Lee YP; Graduate School of IPS, Waseda University, Fukuoka, Japan.
  • Wang CZ; Department of Physics, Hanyang University, Seoul, Korea.
  • Lynch DW; Department of Physics, Iowa State University, Ames, Iowa, USA.
  • Guo JP; Department of Physics, Iowa State University, Ames, Iowa, USA.
  • Chen LY; Department of Electrical &Computer Engineering, University of Alabama in Huntsville, Alabama, USA.
Sci Rep ; 7: 44614, 2017 03 16.
Article em En | MEDLINE | ID: mdl-28300178
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2017 Tipo de documento: Article País de afiliação: China
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2017 Tipo de documento: Article País de afiliação: China